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Meeting 2021 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Imaging
Presentation Title Study of Structure of Beam-sensitive Supported Nanoparticle Catalysts by Low-dose High Resolution Phase Contrast Imaging
Author(s) Cheng-Han Li, Joerg Jinschek
On-Site Speaker (Planned) Cheng-Han Li
Abstract Scope Phase contrast imaging (PCI) in scanning / transmission electron microscopy (S/TEM) has been widely utilized to reveal the structure of materials with high spatial resolution and high sensitivity. In general, acquisition of an image series, such as focal series, are necessary to generate sufficiently high S/N data that is further processed using algorithm to restore the phase contrast and amplitude contrast images. However, such extended exposure to high-energy electrons might be too invasive for electron-beam-sensitive materials, such as highly active supported nanoparticles catalysts. Thus, strategies have to be applied managing electron dose and minimize invasive electron-beam effects. In this study, high-resolution PCI with optimized electron-dose exposure and fast-speed direct electron detection have been utilized to reveal the pristine microstructure of supported noble metals model catalysts, correlated with simulated images. Low-dose PCI methods are essential to characterize beam-sensitive materials with high spatial resolution.
Proceedings Inclusion? Planned:
Keywords Characterization, Modeling and Simulation,

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Magnetic Correlations and Time Fluctuations in Assemblies of Fe3O4 Nanoparticles Probed via X-rays
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Multi-peak Phase Retrieval for Coherent X-ray Diffraction Imaging at High Energies
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Study of Structure of Beam-sensitive Supported Nanoparticle Catalysts by Low-dose High Resolution Phase Contrast Imaging
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