| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Revisiting the Wilkens Function: a Discrete Dislocation Dynamics-based Study of Strain Broadening in Diffraction Profiles |
| Author(s) |
Aaron E. Tallman, Darshan Bamney, Douglas Spearot, Laurent Capolungo |
| On-Site Speaker (Planned) |
Aaron E. Tallman |
| Abstract Scope |
Accurate diffraction-based estimates of dislocation content provide value to materials modeling and in-service materials evaluation by coupling microstructure characterization with mechanical behavior. Many approaches have been proposed to provide such estimates by analyzing the broadening of diffraction peaks, most of which rely on idealizing dislocation microstructures to make predictions. With the advent of mesoscale modeling of dislocation networks, such strict assumptions may be relaxed. The work here is built using the formulations of line profile analysis as a foundation, while bypassing the idealization of straight dislocations. Discrete dislocation dynamics simulations are used with a virtual diffraction algorithm to generate synthetic diffraction profiles and to establish connections between strain broadening and dislocation content. A data reduction provides a smaller parametric basis to describe microstructure using peak broadening. The reduced data is used to formulate a surrogate model which leverages the physics-derived formulations of line profile analysis to accurately predict dislocation content. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |