| Abstract Scope |
Modern synchrotron facilities provide monochromatic X-rays with high energy and flux. The 3D X-ray Diffraction Microscope (3DXRD) has utilized these capabilities for over two decades, becoming a reliable tool for 3D characterization of polycrystalline materials. In the past eight years, a derivative technique, the scanning 3DXRD microscope, has emerged. It uses a narrow X-ray beam combined with raster scanning to capture spatial details at the sub-grain level in 3D. In scanning 3DXRD, the diffraction signal from different sub-domains within crystals is highly sensitive to the lattice deformation field. I pioneered several regression frameworks to reconstruct the intra-grain strain tensor and rotation fields from such data. In this talk, I will survey the history of scanning 3DXRD, present the state-of-the-art capabilities of the microscope, showcase its benefits and limitations, and discuss future developments in scanning 3DXRD. |