About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Towards Single-Pattern Absolute High angular Resolution EBSD without using Simulated Patterns as Reference |
Author(s) |
Tijmen Vermeij, Lloyd R. Dodsworth, Aimo Winkelmann, René De Kloe, Johan P.M. Hoefnagels |
On-Site Speaker (Planned) |
Tijmen Vermeij |
Abstract Scope |
High angular Resolution EBSD (HR-EBSD) offers measurement of misorientations and relative elastic strains with high sensitivity. However, in the absence of stress-free intragranular reference points, absolute stress measurements are challenging. The extension to absolute HR-EBSD by using a simulated EBSD pattern as a reference suffers from inaccurate simulation of EBSD patterns and uncertainty in experimental EBSD geometry. Therefore, we propose a novel absolute HR-EBSD approach that eliminates the need for a stress-free (simulated) reference pattern, by exploiting crystal symmetry in a consistent integrated digital image correlation framework. We correlate one area within a pattern to another area of the same pattern, in parallel for all available crystal symmetry operators, while using absolute stress components, absolute orientation, and pattern centre parameters as degrees of freedom. We demonstrate the method on idealized simulated patterns and further experiment with single experimental stress-free patterns, for which an integrated excess-deficiency correction approach has been developed. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, |