| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Elastic and Plastic Field Measurement During Deformation of Polycrystalline Metallic Materials by Heaviside Digital Image Correlation |
| Author(s) |
J.C. Stinville, Patrick Callahan, M. P. Echlin, Marie-Agathe Charpagne, Patrick Villechaise, Jonathan Cormier, D. Texier, Valery Valle, T. M. Pollock |
| On-Site Speaker (Planned) |
J.C. Stinville |
| Abstract Scope |
In polycrystalline metallic materials, the measurement of the spatial distribution of sites of plastic localization over large areas provides unique opportunities to determine the effect of the microstructure on the deformation processes. The combination of scanning electron microscopy and digital image correlation (DIC) has emerged as a robust method for experimental quantification of the strain fields at the microstructure scale over large representative regions. A discontinuity-tolerant DIC method, Heaviside-DIC, has been recently developed to account for discontinuities in the displacement field, such as produced by slip or grain boundary sliding. Moreover, the Heaviside-DIC method has been implemented to extract the elastic (lattice expansion) and rotational (lattice rotation) fields at the sub-grain scale during plastic deformation. This will be demonstrated during deformation of a nickel base 718 superalloy and a titanium Ti-6Al-4V alloy. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |