| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
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| Presentation Title |
Spherical Indexing Based on Dictionary Indexing Applied to Overlapping Pattern of Low-scattering Forsterite Due to Small Grain Sizes |
| Author(s) |
Alexandra Austin, René de Kloe, Katharina Tinka Marquardt |
| On-Site Speaker (Planned) |
Katharina Tinka Marquardt |
| Abstract Scope |
Complex, low-symmetry crystal structures, weak scattering, beam damage and charging are common problems causing low quality EBSD patterns. This in combination with complex microstructures, deformation, and wide ranges of grain sizes present challenges for EBSD analysis. In this study we successfully mapped the orientations of synthetic polycrystalline Mg2SiO4 with an average grain size of 400 nm that was produced by spark plasma sintering 1. 10 kV accelerating voltage and 60 nm step size were used to collect patterns with the Clarity EBSD detector. The Kikuchi patterns were indexed using the Spherical Indexing based on the dictionary indexing approach (DI)2 implemented in EDAX OIM software . This method allows accurate indexing of lower quality patterns3. We compare the grain boundary plane distribution of Hough and SI routines.
1 Koizumi et al. Phys. Chem. Miner. (2010)
2 Chen et al. Microsc. Microanal. (2015)
3 Marquardt et al. Am. Mineral. (2017) |
| Proceedings Inclusion? |
Planned: |