About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
On-Site Characterization of Single-Crystal Elastic Moduli Via High Energy X-Ray Diffraction Microscopy and Synthetic Polycrystalline Modeling |
Author(s) |
Wiley Kirks, Paul Dawson, Matthew Miller, Kelly E. Nygren |
On-Site Speaker (Planned) |
Wiley Kirks |
Abstract Scope |
Advancements in synchrotron light sources and x-ray diffraction techniques have allowed for the characterization of new and desirable polycrystalline materials – providing phase, orientation, and microscopic elastic strain measurements within bulk material at the grain-scale. Ideally, the local micromechanical stress state can be calculated from these elastic strains using single-crystal elastic moduli, but these values are rarely available for materials that haven’t been intensively studied. This work establishes a reliable on-site method of moduli characterization for synchrotron users performing in situ mechanical tests, coupling high energy X-ray diffraction microscopy (HEDM) and synthetic polycrystalline modeling to calculate the elastic moduli. The accuracy and effect of microstructural detail necessary for quality approximation of the single-crystal elastic constants will be discussed. The methodology will be demonstrated on the Niobium alloy C-103. |
Proceedings Inclusion? |
Planned: |
Keywords |
Mechanical Properties, Characterization, |