| About this Abstract |
| Meeting |
TMS Specialty Congress 2025
|
| Symposium
|
Joint Sessions of AIM, ICME, & 3DMS
|
| Presentation Title |
Innovations in 3D EBSD for Advanced Materials Characterization |
| Author(s) |
Andrew Polonsky, Chad Hovey, James Lamb, Paul Chao, McLean Echlin, Hojun Lim, Kyle Johnson, Julia Deitz, Tresa Pollock |
| On-Site Speaker (Planned) |
Andrew Polonsky |
| Abstract Scope |
Recent advancements in automation have transformed materials characterization techniques over the past decade. The capability to perform serial-sectioning within an electron microscope using ion or laser beams has facilitated the acquisition of high-fidelity 3D electron backscatter diffraction (EBSD) data, resulting in increasingly large datasets. Here we explore the application of 3D EBSD to analyze microstructures obtained through serial-sectioning with the TriBeam system, revealing insights into these materials that traditional methods cannot provide. We will address analytical considerations for non-equilibrium microstructures, such as those produced by macroscopic plastic deformation or additive manufacturing. Additionally, we will outline workflows for automated management of multi-terabyte datasets and present novel collection and analysis tools designed to minimize the reliance on specialized knowledge, thus making this advanced technique more accessible to a broader audience. Furthermore, we will discuss how these datasets can be leveraged for advanced modeling techniques to enhance our fundamental understanding of materials processing. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |