| About this Abstract |
| Meeting |
2021 TMS Annual Meeting & Exhibition
|
| Symposium
|
2D Materials – Preparation, Properties & Applications
|
| Presentation Title |
Elaboration and Characterization of Thin Films of SiP Lamellar Alloys: A First Step towards 2D-SiP |
| Author(s) |
Mathieu Stoffel, Alix Valdenaire, Sébastien Geiskopf, Xavier Devaux, Erwan André, Cedric Carteret, Alexandre Bouché, Michel Vergnat, Hervé Rinnert |
| On-Site Speaker (Planned) |
Mathieu Stoffel |
| Abstract Scope |
Silicon phosphide (SiP) has gained an increasing interest since an indirect to direct bandgap transition was predicted when moving from the bulk to the corresponding 2D material. While some theoretical works are available on 2D-SiP, there is no report concerning the synthesis of 2D-SiP by using mechanical exfoliation of SiP thin films.
In this work, we investigate SiPx thin films prepared by co-evaporation of Si from an e-beam gun and P from a GaP decomposition source. The film properties were investigated by scanning transmission electron microscopy (STEM) and the associated spectroscopies (EDS and EELS), infrared and Raman spectroscopies. Annealing thin films containing 25 at. % of P at temperatures larger than 950°C leads to the formation of a SiP crystalline phase. DFT calculations of the vibrational modes allow us to identify this phase as being orthorhombic SiP. STEM investigations confirm the presence of lamellar SiP grains coexisting with Si crystallites. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Thin Films and Interfaces, Characterization, |