| Abstract Scope |
Defects in crystalline solids, as well as the local atomic environments, play a central role in plastic deformation. Evidence is also emerging of confined phases that remain anchored to crystalline defects including planar faults, grain boundaries and dislocations. Here, we highlight recent developments in defect characterization across a suite of electron microscopy modalities, including both TEM and SEM platforms, the latter of which offers versatility for in-situ testing. We further demonstrate how the information encoded in diffraction patterns collected using SEMs is amplified by a new generation of direct electron detectors that enable high speed mapping and acquisition of high-fidelity patterns that can be used for defect characterization. We will show these techniques applied to in-situ experiments to study the nature of dislocation dynamics in interstitial-engineered refractory BCC multi-principal element alloys and FCC alloys hosting local chemical and structural ordering in the vicinity of dislocation cores. |