About this Abstract |
| Meeting |
2024 ASC Technical Conference, US-Japan Joint Symposium, D30 Meeting
|
| Symposium
|
2024 ASC Technical Conference, US-Japan Joint Symposium, D30 Meeting
|
| Presentation Title |
Correlating Microscale Damage with Dielectric State Variable Characterized by Broadband Dielectric Spectroscopy (BbDS) |
| Author(s) |
Shiyao Lin, Vamsee Vadlamudi |
| On-Site Speaker (Planned) |
Shiyao Lin |
| Abstract Scope |
Progressive damage and failure analysis is of pivotal importance for the design and certification of aerospace composite structures. Broadband dielectric spectroscopy (BbDS) is an emerging non-destructive evaluation (NDE) and structural health monitoring (SHM) technique that inspects the in-situ dielectric response as a function of damage development. BbDS offers a unique capability to characterize microscale matrix cracking in composites that are usually nondetectable by digital image correlation (DIC) or ultrasound scanning. However, the fundamental mechanism connecting the microscale damage and dielectric properties calls for more thorough investigations. This paper aims to bridge this multiphysics correlation between the microscale damage modeled by Enhanced Schapery Theory (EST) and a charge/current conservation-based dielectric model. Through calibrating mechanical and dielectric predictions with experimental data, we will elucidate the relationship between microscale matrix cracking and dielectric properties. This correlation is anticipated to provide physical insights into the effects of microscale damage on dielectric responses, thereby expanding the applications of BbDS as an NDE, and SHM technique and enhancing the opportunities of multiphysics modeling for composites. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |