| About this Abstract |
| Meeting |
MS&T21: Materials Science & Technology
|
| Symposium
|
Additive Manufacturing of Metals:
ICME Gaps: Material Property and Validation Data to Support Certification
|
| Presentation Title |
On Scan Path Knowledge for Model Informed Process Planning and Material Quality Predictions |
| Author(s) |
Emil Duong, Lukas Masseling, Ulrich Thombansen, Christian Knaak, Mustafa Megahed |
| On-Site Speaker (Planned) |
Mustafa Megahed |
| Abstract Scope |
Scan paths have been shown to play a significant role in printing accuracy, defect generation and material quality. Open processes such as DED enable access to virtual and digital twins to path planning tools and files thus supporting a complete representation of the process and the component thermal history. Processes where path planning is not available, such as in commercial LPBF systems, pose a significant challenge to modelers limiting research efforts to trial and error and reverse engineering machine behavior before focusing on technological progress. In this presentation a DED hybrid twin consisting of physics- and data-based models will be presented. In contrast physics-based LPBF models are used to demonstrate the negative effect of inaccurate path planning knowledge on numerical predictions. As a result LPBF digital twins must represent several process unknowns as well as the material response to process parameters. |