About this Abstract |
Meeting |
6th World Congress on Integrated Computational Materials Engineering (ICME 2022)
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Symposium
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6th World Congress on Integrated Computational Materials Engineering (ICME 2022)
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Presentation Title |
In-situ Testing to Acquire HR EBSD and DIC Strain Data within a Coincident Domain |
Author(s) |
Will Gilliland, Sam Poulton, Timothy Ruggles, Geoffrey Bomarito, Andrew H Cannon, Jacob Hochhalter |
On-Site Speaker (Planned) |
Will Gilliland |
Abstract Scope |
For this project, an inked rubber stamp was applied to a small Inconel 718 specimen. The stamp transferred a thin pattern with microscale features for digital image correlation (DIC). The pattern is easily visible at lower voltages and also thin enough to not obstruct backscattered electrons. The unique characteristics of the pattern enabled the concurrent acquisition of DIC and high-resolution electron backscatter diffraction (HR EBSD) data while the specimen was loaded in-situ. The challenges of in-situ testing and combining EBSD with DIC measurements are discussed. By combining the elastic strains (from HR EBSD) and total strains (from DIC) the result of this approach is an estimate of stress-strain behavior at points across the specimen surface. This combined dataset can then be used as higher-fidelity data in the calibration of crystal plasticity models. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. |
Proceedings Inclusion? |
Definite: Other |