| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Refractory Metals 2025
|
| Presentation Title |
Characterizing recrystallization in Type 2 and Type 5 Nb |
| Author(s) |
Thomas J. Bennett, Eric M. Taleff |
| On-Site Speaker (Planned) |
Thomas J. Bennett |
| Abstract Scope |
Recrystallization in Type 5 (RRR grade) Nb significantly affects the performance of superconducting radio frequency cavities used in high-energy physics applications. Residual dislocation density and low-angle grain boundaries can selectively precipitate hydrides that quench the superconducting state. The propensity of Type 5 and Type 2 (commercial grade) Nb materials to recrystallize were measured as functions of cold work and annealing temperature. New microscopy and data analysis techniques were developed to characterize recrystallized grain size and recrystallized area fraction. Multiple backscattered electron images acquired using slightly different imaging geometries were combined to reveal microstructure not visible from a single imaging geometry. A new algorithm to segment data from recrystallized microstructures into grains was used to measure grain size. Automated digital image analysis identified unrecrystallized regions in data from partially recrystallized microstructures. Resulting data demonstrate the profound impact of interstitial impurities on the recrystallization of Nb. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
High-Temperature Materials, Characterization, |