| Abstract Scope |
Efficient acquisition and analysis of large datasets from advanced characterization techniques, such as S/TEM, are critical for optimizing material design and processing. Investigating nanoscale microstructural changes—both structural and chemical—requires extensive data collection, often generating large volumes of information. Recent advancements in instrumentation, which offer higher throughput, resolution, and simultaneous signal acquisition, have only intensified the challenge of managing these data-rich environments.
To address this, new strategies are being developed. For data acquisition, ‘smart scanning’ techniques selectively focus on key regions of interest (ROIs) before employing time- and data-intensive analyses such as EDX and 4D-STEM. On-the-fly data processing is also gaining traction, enabling real-time extraction of information, such as secondary phase morphology and chemistry, during automated data collection. This reduces the need for time-consuming post-processing and data transfer. Additionally, improved hardware-software integration in modern TEMs, along with advanced scripting capabilities, allows for tailored experimental setups, enhancing efficiency.
This presentation will outline the development of these approaches and discuss the remaining challenges that must be addressed to further optimize TEM-based data collection and analysis. |