| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior Related to Interface Physics IV
|
| Presentation Title |
Exploring interface fracture in thin film structures using diffraction-based techniques |
| Author(s) |
Alice Lassnig, Christoph Gammer, Michael Meindlhumer, Megan Jo Cordill, Andrew M. Minor |
| On-Site Speaker (Planned) |
Alice Lassnig |
| Abstract Scope |
Understanding interface failure as a function of thin film properties is crucial to control delamination. This study investigates the role of ductile thin film properties on interfacial delamination from brittle substrates by measuring strains with diffraction-based techniques, using synchrotron radiation and transmission electron microscopy (TEM), both in situ and post-delamination, allowing to decouple the elastic and plastic deformation in the thin films. Measuring stresses and strains with nanometer resolution allows one to reveal toughening mechanisms correlated with improved adhesion values.
In the second part of this study, we focus on the layer architecture of crystalline-amorphous nanolaminates. Using TEM combined with in situ deformation fatigue experiments we examine crack propagation behavior across interfaces as a function of layer architecture. In situ fatigue tests, combined with 4D STEM analyses, provide direct observations and analysis of crack-interface interactions that can identify toughening mechanisms. Our findings demonstrate that layer spacing significantly influences the fracture properties in nanolaminates. |
| Proceedings Inclusion? |
Planned: |