About this Abstract |
Meeting |
2024 TMS Annual Meeting & Exhibition
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Symposium
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AI/Data Informatics: Computational Model Development, Verification, Validation, and Uncertainty Quantification
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Presentation Title |
A Needed Bridge Between the Microscopy and Data Science Communities: Electron Backscatter Diffraction and Machine Learning Case |
Author(s) |
Julian Escobar, Benjamin Schuessler, Jenna A Pope, Keerti Sahithi Kappagantula, Matthew J Olszta, Donald R Todd |
On-Site Speaker (Planned) |
Julian Escobar |
Abstract Scope |
Electron backscatter diffraction (EBSD) is one of the most widespread microstructural characterization techniques within the materials science community. Although EBSD characterization is somewhat routinary, the outcome information is generally not standardized (size, resolution, format, among others), and the concept of ‘good quality’ data may vary from scientist to scientist. This becomes especially critical for the machine learning and artificial intelligence community, which uses microscopy data as input for further analysis and training approaches. Therefore, standardizing microscopy data outcome to a controlled format that meets AI/ML quality standards becomes a fundamental task to effectively bridge both microscopy and data science needs. This work proposes the use of a semi-automated standardized EBSD data treatment recipe using the MTEX toolbox on Matlab, which reduces error propagation and generates a controlled data output. This approach is especially useful for big data cases, where very large numbers of samples need to be addressed. |
Proceedings Inclusion? |
Planned: |
Keywords |
Machine Learning, Characterization, Shaping and Forming |