| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
2024 Technical Division Student Poster Contest
|
| Presentation Title |
SPG-40: In Situ Correlative Transmission Electron Microscopy for Experimental Study of Grain Growth in Thin Films |
| Author(s) |
Matthew Patrick, Katayun Barmak, Jeffrey M. Rickman |
| On-Site Speaker (Planned) |
Matthew Patrick |
| Abstract Scope |
The dynamic study of grain growth has only recently become practical using in situ and quasi-in situ correlative transmission electron microscopy (TEM)-based techniques. This poster summarizes our recent in situ heating experiments on metallic thin films. TEM-Images were captured in conical bright field mode during heating and grain boundaries were automatically detected using our recently reported approach. Periodically, the sample was quenched and the region which was imaged was orientation mapped using precession enhanced electron diffraction. These orientation maps were then used to reconstruct the 5-parameter character of each grain boundary and based on microstructural markers like grain centroids and triple junction locations, the crystallographically defined boundaries were correlated to data measured from the direct-space information captured during microstructural evolution. Cross-cutting data like these offer a holistic characterization of microstructure during grain growth, and represent an important step in developing prescriptive theories of coarsening. |
| Proceedings Inclusion? |
Undecided |
| Keywords |
Thin Films and Interfaces, Characterization, |