About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
Presentation Title |
New Capabilities From the APS-Upgrade at the New 3D Micro/Nano Diffraction Station |
Author(s) |
Jon Tischler |
On-Site Speaker (Planned) |
Jon Tischler |
Abstract Scope |
The recently completed upgrade of the Advanced Photon Source (APS) increases the brightness of the undulator sources by a factor of ~100. For micro-focusing/diffraction this provides a factor of 100 increase in the brightness of the focused spot. The improved instrument at the 3DMN station should thus have both more power and a smaller spot size of ~150 nm. In addition, using the newly developed technique to obtain depth resolution using a 1D coded aperture we expect data collection times to drop by and additional factor of ~5 with improved signal/noise. The combination of the coded aperture with the increased brightness should reduce collection times by more than a factor of 20 with an improved transverse resolution more than 2 times smaller. This talk will present examples of the first measurements and an appraisal of the improvements, as well as other improvements. |
Proceedings Inclusion? |
Undecided |