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Meeting 2025 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Coherent Imaging
Presentation Title Single-Exposure Elemental Differentiation and Texture-Sensitive Phase-Retrieval Imaging with a Neutron-Counting Microchannel-Plate Detector
Author(s) Brian Abbey, Benedicta D. Arhatari, David M. Paganin, Henry Kirkwood, Anton S. Tremsin, Timur E. Gureyev, Alexander M. Korsunsky, Winfried Kockelmann, Felix Hofmann, Eric Huwald, Shu-Yan Zhang, Joe Kelleher
On-Site Speaker (Planned) Brian Abbey
Abstract Scope Microchannel-plate (MCP) detectors, when used with pulsed-neutron-source instruments, enable high spatial resolution and high contrast imaging with pixel-level spectroscopic data. Our recent study showcases the potential for multimodal analysis, including total neutron cross-section spectra measurements, quantitative material differentiation imaging, and texture-sensitive in-line phase imaging, all from a single exposure using an MCP detector [1]. Operating in full-field imaging mode, the neutron transmission spectra are captured at each detector pixel, eliminating the need for energy scanning. The study demonstrates good agreement with library reference data for neutron cross-section spectra. Elemental differentiation imaging is achieved by using two selected energy bandwidths. Additionally, phase-retrieval imaging results reveal changes in texture, such as preferred grain orientation, in the sample. This approach highlights the versatility and efficiency of MCP detectors for comprehensive material analysis in neutron imaging. [1] Arhatari, B.D., et al,. Physical Review A, 2024. 109(5): p. 053529.
Proceedings Inclusion? Planned:
Keywords Characterization, Aluminum, Other

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

AI-Driven Workflow for Autonomous High-Resolution Scanning X-Ray Microscopy
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Characterization of Crystalline Materials at the Atomic Scale with X-Ray Bragg Coherent Diffraction Imaging
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Direct Reciprocal Space Detection of Microelectronic Defects Using Coherent X-Ray Diffraction and Unsupervised Machine Learning
Enhanced Mineral Characterization With 3D X-Ray CT and AI-Driven Imaging
Explanation of the High-Dielectric Constant of BaTiO3 Used in Multilayer Capacitors
High-Resolution X-Ray Imaging of Integrated Circuits
High Bandwidth Scanning X-Ray Microscopy
In-Situ/Operando Bragg Coherent X-Ray Diffraction Imaging for Catalysis Studies
ML-Guided Non-Destructive 3D Metrology of Functioning Devices With an X-Ray Laser
Nanoholotomography With Coded Apertures for Efficient Dynamic Imaging of Nanomaterials
Operando and Linear Dichroic Ptychographic Spectro-Tomography of Heterogenous Catalysts
Origin of Structural Degradation in Layered Oxide Cathode for Li-Ion Batteries
Physics-Informed Self-Supervised Learning of Structural Morphology Imaged by Scanning X-Ray Diffraction Microscopy
Probing Cryogenic Strain Evolution in SrTiO3 Using Multi-Reflection Bragg Coherent Diffraction Imaging
Rapid Reconstruction of the Full Strain Tensor via Coupled Phase Retrieval With Multipeak Bragg Coherent Diffraction Imaging
Real-Time Imaging of Subsurface Dislocation Dynamics
Simultaneous Reciprocal and Real Space X-Ray Imaging for Hierarchical Characterization of 3D Nano-Architected Metamaterials
Single-Exposure Elemental Differentiation and Texture-Sensitive Phase-Retrieval Imaging with a Neutron-Counting Microchannel-Plate Detector
Single-Shot X-Ray Imaging of Density in Laser Shocked Materials for Fusion Energy Studies
Synchrotron Ptychographic X-Ray Computed Tomography (PXCT) to Study Micro-Fabricated Fully Hybrid 3D Metal-Ceramic Metamaterials
Three-Dimensional Hard X-Ray Ptychographic Reflectometry Imaging on Extended Mesoscopic Surface Structures

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