| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
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Materials Science for Global Development -- Health, Energy, and Environment: An SMD Symposium in Honor of Wole Soboyejo
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| Presentation Title |
Scale-enabled Subcritical Crack Growth Mechanisms in Thin Sheet Materials |
| Author(s) |
Christopher L. Muhlstein |
| On-Site Speaker (Planned) |
Christopher L. Muhlstein |
| Abstract Scope |
In this presentation I will highlight how W.O. Soboyejo’s research has influenced our ongoing studies of scale-enabled, subcritical crack growth in thin sheet materials. Subcritical crack growth mechanisms in small (micrometer-scale) specimens are often very similar to the behavior observed in conventional (millimeter-scale and larger) specimens. However, several unique fatigue and steady-state crack growth mechanisms operate in thin sheet and small-scale specimens. Reaction-layer fatigue has emerged as an important mechanism for fatigue crack initiation and damage accumulation in thin films of semiconductors such as Si and metals such as Ni and Pt. Similarly, ductile tearing in coarse-grained metallic foils (Al, Cu, and Ti) proceeds by a steady-state crack growth mechanism that is only observed in thin sheets. The critical role of material form and scale in subcritical, steady-state crack growth becomes clear when we compare the behavior of thin sheets of ductile metals to paper (a network-structured material). |
| Proceedings Inclusion? |
Planned: |