| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Toward Correlative Grain Boundary Analysis in CIGS |
| Author(s) |
Marzieh Baan, Tyler Grassman |
| On-Site Speaker (Planned) |
Marzieh Baan |
| Abstract Scope |
Prior work in the CuInGaSe2 (CIGS) thin-film photovoltaic materials system has identified defect levels with energies close to mid-gap energy and thus likely strong carrier recombination centers. These defects tend to cluster at specific grain boundaries, but the characteristics of these boundaries and their relationship to defect clustering and formation remain unknown. EBSD orientation mapping, correlated with site-specific defect-sensitive spectroscopies, should provide crucial insights into these issues. However, the naturally rough surfaces of CIGS — flattening risks altering the near-surface defect regions of interest — makes conventional EBSD extremely challenging, resulting in low signal-to-noise and unreliable, inaccurate indexing. Nonetheless, the use of spherical indexing for EBSD analysis of rough, un-flattened CIGS samples is found to yield much higher indexing accuracy, with a high grain-to-grain orientation correlation (r= 0.68) compared to analysis of the same regions after flattening, than that of conventional Hough indexing, paving the way for ongoing correlative analyses. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Electronic Materials, Characterization, Thin Films and Interfaces |