About this Abstract |
Meeting |
2022 TMS Annual Meeting & Exhibition
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Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Strain Rate Dependent Deformation and In-situ TEM Crystallization in Crystalline/Amorphous Ni-Zr Thin Films |
Author(s) |
Bibhu Prasad Sahu, Amlan Dutta, Rahul Mitra |
On-Site Speaker (Planned) |
Bibhu Prasad Sahu |
Abstract Scope |
The three different composition of Ni-Zr thin films having different crystalline and amorphous phase fraction has been studied for nano-indentation creep behaviour at a range of loading strain rates. Time-dependent relaxation during different loading rates has a great effect on the evolution and disappearance of shear bands along with the nanocrystallization during indentation of the crystalline as well as amorphous Ni-Zr thin films. Further, the stages of crystallization of the amorphous Ni-Zr film have been investigated by differential scanning calorimetry (DSC) and in-situ annealing in a high resolution transmission electron microscopy (HRTEM). The difference in crystallization behaviour of the amorphous film in ex-situ DSC experiment from that of in-situ TEM observation is attributed to structural relaxation with reduction of free volume during thermal activation. Interestingly, the in-situ HRTEM annealing of the amorphous film gives the evidence of grain rotation as well as twinning-detwinning phenomena during the intermediate stages. |
Proceedings Inclusion? |
Planned: |
Keywords |
Thin Films and Interfaces, Characterization, Mechanical Properties |