About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
|
Symposium
|
Aluminum Alloys: Development and Manufacturing
|
Presentation Title |
Effect of post-annealing on mechanical properties and microstructural evolution of ultrafine grain hypoeutectic Al-Si conductor wires |
Author(s) |
Mohammad Khoshghadam Pireyousefan, Mousa Javidani, Alexandre Maltais, Julie Lévesque, X.-Grant Chen |
On-Site Speaker (Planned) |
Mousa Javidani |
Abstract Scope |
Ensuring high thermal stability in Al conductor cables is crucial for power transmission, as strength degradation during electricity transmission poses a risk to overhead lines. This study examined the strength degradation of an ultrafine grain hypoeutectic Al-Si alloy by investigating its microstructural evolution during post-annealing. The primary strengthening mechanisms in the Al-Si wire included strain hardening, grain-boundary strengthening, and nano-Si precipitates. The study revealed that microstructural changes are influenced by both the temperature and duration of post-annealing. At 90 °C, slight strength reduction occurs due to defect recovery, such as vacancies and dislocations. At 300 °C, grain growth and coarsening of Si precipitates contribute to strength degradation. These findings underscore that dislocation recovery, recrystallization, grain growth, and precipitate coarsening are the main factors driving strength degradation in Al-Si wires. |
Proceedings Inclusion? |
Planned: Light Metals |
Keywords |
Aluminum, Characterization, Mechanical Properties |