| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Aluminum Alloys: Development and Manufacturing
|
| Presentation Title |
Effect of Post-Annealing on Mechanical Properties and Microstructural Evolution of Ultrafine Grained Hypoeutectic Al-Si Conductor Wires |
| Author(s) |
Mohammad Khoshghadam Pireyousefan, Mousa Javidani, Alexandre Maltais, Julie Lévesque, X.-Grant Chen |
| On-Site Speaker (Planned) |
Mousa Javidani |
| Abstract Scope |
To ensure reliable power transmission, maintaining high thermal stability in aluminum conductor cables is essential, as strength degradation may occur due to the increased temperature of overhead cables during service. This study examined the strength degradation of an ultrafine grained hypoeutectic Al-Si alloy by investigating its microstructural evolution during post-annealing. The primary strengthening mechanisms in the Al-Si wire include strain hardening and grain boundary strengthening. This study revealed that microstructural changes were influenced by both the temperature and duration of post-annealing. At 90 °C, a slight strength reduction occurred owing to defect recovery, such as vacancies and dislocations. At 250 °C, grain growth and dislocation density reduction contributed to strength degradation. These findings indicate that dislocation recovery, recrystallization, and grain growth are the main factors driving strength degradation in Al-Si wires. |
| Proceedings Inclusion? |
Planned: Light Metals |
| Keywords |
Aluminum, Characterization, Mechanical Properties |