| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale V
|
| Presentation Title |
What Controls Damage Tolerance in Repetitive Nano- and Micro-scale Impact Testing of Thin Films? |
| Author(s) |
Ben Beake, Sam McMaster, Luis Isern, Tomasz Liskiewicz, Jose Endrino |
| On-Site Speaker (Planned) |
Ben Beake |
| Abstract Scope |
Improving the fatigue and fracture resistance of thin films under highly mechanically loaded repetitive contact conditions is an important step to increasing their performance in demanding applications. As a screening tool to evaluate promising thin film architectures rapid nano- and micro-scale laboratory tests can be highly effective but they need to be corrected dimensioned. Nano-impact tests with sharp cube corner indenters highlight differences in resistance to contact damage. Micro-impact tests at significantly higher strain rate and energy allow study of thin film fatigue with spherical indenters enabling the thin film-substrate system behaviour to be studied as a whole. This presentation will investigate the role of thin film microstructure and mechanical properties on the damage tolerance at the different length scales probed in the nano- and micro-scale tests. Design rules for enhanced damage tolerance are proposed. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |