| About this Abstract |
| Meeting |
2023 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2023)
|
| Symposium
|
2023 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2023)
|
| Presentation Title |
Enhancement of Profile Data for Repetitive Process Control Measurements in DED Additive Manufacturing |
| Author(s) |
Kyle Saake, Elias Snider, Douglas Bristow |
| On-Site Speaker (Planned) |
Kyle Saake |
| Abstract Scope |
Layer-to-layer repetitive process control (RPC) is a powerful tool in minimizing defects for direct energy deposition (DED) additive manufacturing, specifically for blown powder systems. Layer-to-layer feedback control structures require a profile scanner (a Keyence profilometer in this work) to be integrated between layers for error measurements. Obtaining quality scans while minimizing scanning downtime is important for reducing cost in such control structures. An approach for collecting quality scanner data by combining multiple scans is presented. Fitting optimizations are discussed which align scans to produce high-fidelity profiles of printed parts. Example datasets are presented with relevant analysis of data confidence and validation metrics. Integration of the scanning algorithm into the existing RPC structure is discussed with implications on the build process. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |