About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
Presentation Title |
K-7: Comparative Analysis of Bulk and Local State of Thin Film Viscoelastic Material on a MEMS Device Using Dynamic Nanomechanical Characterization |
Author(s) |
Hasan Faisal, Milosh Mededovic, Patrick O'Hara |
On-Site Speaker (Planned) |
Hasan Faisal |
Abstract Scope |
Instead of big advancement in the field of instrumented indentations, characterization of the soft viscoelastic material is still a challenging task. To this end, Anton Paar Ultra Nano Hardness Tester was employed to capturr the dynamic nanomechanical properties of thin viscoelastic silicone material. In this study, a unique surface referencing technique of the indentation testing was used to characterize the silicone material in bulk state and in local state on a MEMS device. To understand the local and bulk property variation, three different samples were tested with varying degree of curing. The indentation results show it can successfully capture the nanomechanical material property in both bulk and local encapsulated phase of sillicone. The dynamic response of three varying degrees of cured samples showed a dynamic storage modulus varies from 3.5 MPa to 4 MPa, whereas the loss modulus of the material was found around 0.55 MPa. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |