About this Abstract |
Meeting |
2022 TMS Annual Meeting & Exhibition
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Symposium
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AI/Data Informatics: Computational Model Development, Validation, and Uncertainty Quantification
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Presentation Title |
One-stage Simulation of EBSD Patterns over Multiple Parameters through a CVAE-GAN Model |
Author(s) |
Zihao Ding, Marc De Graef |
On-Site Speaker (Planned) |
Zihao Ding |
Abstract Scope |
Currently, the mainstream approach for electron backscatter diffraction (EBSD) pattern simulation is through a physics-based forward model, which first computes the back-scattered yield over all directions, and then generates patterns corresponding to certain orientations through a gnomonic projection. The first stage is time-consuming, limiting its application when there is variation in parameters other than orientation. For discriminative purposes, the EBSD-CNN and EBSDDI-CNN approaches have proved great feature extraction capability of deep neural networks in this domain. Recently, we have shown that a conditional variational autoencoder (CVAE) can realize parametric simulation of EBSD patterns. As a preliminary verification, it takes orientation as the only variable input. In this study, the model is combined with a generative adversarial network (GAN) to realize EBSD pattern simulation over multiple parameters. Compared with the conventional forward model, the deep generative model summarizes the distribution of back-scattered electrons at a higher level. |
Proceedings Inclusion? |
Planned: |
Keywords |
Machine Learning, Characterization, Computational Materials Science & Engineering |