| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XIX
|
| Presentation Title |
D-13: Effects of Current Stressing on Mechanical Property and Microstructure of an Fe-Ni Alloy at Ambient Temperature |
| Author(s) |
Jun-Jia Huang, Kwang-Lung Lin |
| On-Site Speaker (Planned) |
Jun-Jia Huang |
| Abstract Scope |
Electromigration is a phenomenal process that can induce recrystallization without traditional deformation. Previous studies found that electric current can induce non-deformation electro-recrystallization and cause electro-refining on bonding wire and solder materials. The study investigated the electro-recrystallization behavior of an Fe-Ni alloy (Invar 36, Fe-36%Ni gamma phase solid solution). Typical recrystallization temperature needs to be higher than 0.4 times of melting point temperature, and common manufacturing processes for Invar 36 using temperature even up to 830℃ to cause recrystallization and homogenization. The present study adopted 7000~8000 A/cm^2 electric current and various stressing cycles to investigate the effects of electrical current on Vickers microhardness and microstructure of Invar 36 strips. The process was conducted at ambient condition well below 0.4 times of the alloy melting point. Microhardness of the annealed alloys vary between 150~170 HV depending on stressing conditions. The microstructures were analyzed by XRD, SEM/EBSD, and TEM. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |