| About this Abstract |
| Meeting |
2022 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Improving 2D Diffraction Peak Detection Using Shannon Entropy |
| Author(s) |
Kieran Nehil-Puleo, Jonthan Z Tischler, Philip Eisenlohr |
| On-Site Speaker (Planned) |
Philip Eisenlohr |
| Abstract Scope |
High-energy X-ray diffraction at synchrotron facilities frequently utilizes area detectors since the positions of diffraction peaks encode useful information about the illuminated crystal lattice. To pinpoint these locations, we propose a novel strategy that filters the raw (and typically noisy) intensity by calculating the Shannon entropy within a sliding window. The resulting image is thresholded at a value determined from the 90% and 95% intensity percentile. The intensity-weighted averaged positions of the resulting islands are then taken as the respective peak locations. We compare this modified strategy to the one presently established at beamline 34-ID-E (Advanced Photon Source) and found it to be more robust when the signal-to-noise ratio is low. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |