About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
3rd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2025)
|
Presentation Title |
Enhanced Resolution and Image Contrast in 3D XRM Data Using Deep Learning Based Reconstruction Methods |
Author(s) |
Kaushik Yanamandra, Hrishikesh Bale, Rajarshi Banerjee |
On-Site Speaker (Planned) |
Kaushik Yanamandra |
Abstract Scope |
Deep learning-based 3D reconstruction methods can greatly improve the achievable resolution in image quality in 3D X-ray computed tomography compared to traditional reconstruction methods by utilizing trained models that can eliminate noise and increase contrast. Furthermore, combination with scintillator-based magnification objectives this technique can push the boundaries of achievable resolution. There have been significant developments since the early versions of deep learning based reconstruction. By adopting approaches like synthetic prior in the training step, a significant improvement in image sharpness and overall image quality along with improved throughput has been achieved. Results obtained from this new method are demonstrated on a model Ni-Ti-C based Metal Matrix Composites sample, wherein the complex microstructure and alignment of reinforcing titanium carbide (TiC) phases within the nickel matrix was revealed. This approach underscores the pivotal role of incorporating advanced deep learning-based reconstruction methods in pushing the boundaries of non-destructive 3D imaging characterizing advanced materials. |
Proceedings Inclusion? |
Undecided |