About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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Characterization: Structural Descriptors, Data-Intensive Techniques, and Uncertainty Quantification
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Presentation Title |
Machine Learning and Electron Backscatter Diffraction |
Author(s) |
Alessandro Previero, Guillaume de Certaines, Alex Foden, Thomas Benjamin Britton |
On-Site Speaker (Planned) |
Thomas Benjamin Britton |
Abstract Scope |
Electron backscatter diffraction (EBSD) is a data-rich, analysis technique. Each diffraction pattern contains information about the crystal phase and orientation of the material within the electron beam interaction volume. The advent of high-quality, dynamical-based electron diffraction simulations enables us to explore and test new analysis approaches. We apply (un)supervised machine learning methods, focusing on convolutional neural networks, transfer learning, and principal component analysis to augment the capabilities of the technique. Inspection of the trained networks also provides direction for the next generation of deterministic analysis procedures that we will use to classify phases and crystal orientations, especially for challenging cases such as differentiation of FCC-Cu patterns from austenite (also FCC). We will explore the benefits and disadvantages of these approaches considering current state-of-the-art diffraction pattern analysis methods. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |