| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Measurement of the Thermal Expansion of Ti-7Al Using High Energy X-ray Diffraction Microscopy |
| Author(s) |
Rachel Lim, Darren Pagan, Joel Bernier, JY Peter Ko, Anthony Rollett |
| On-Site Speaker (Planned) |
Rachel Lim |
| Abstract Scope |
Hexagonal metals have anisotropic coefficients of thermal expansion (CTEs), and there is little agreement in literature on the CTEs for these metals. Far-field high energy x-ray diffraction microscopy, a non-destructive, in situ, micromechanical characterization technique, has been used to determine the anisotropic CTEs for Ti-7Al. Two samples of polycrystalline Ti-7Al were continuously heated from room temperature to 850°C while far-field HEDM scans were being taken. The lattice parameters at a given temperature were calculated based on the distribution of lattice parameters of the individual grains. The results showed that the CTEs in were different in the a- and c-directions respectively, and both dropped as a function of temperature. It was also found that the equivalent strain and von Mises stress were lower after the thermal cycle with the outliers in the initial state having shifted the most after the thermal cycle. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |