| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
2025 Technical Division Student Poster Contest
|
| Presentation Title |
SPG-27: Synchrotron Radiation Based Observation of η and η′ Phases of Cu₆Sn₅ Under Electric Current |
| Author(s) |
Shubhayan Mukherjee, Yu-chen Liu, Shih-kang Lin |
| On-Site Speaker (Planned) |
Shubhayan Mukherjee |
| Abstract Scope |
Cu₆Sn₅ is a crucial intermetallic compound found in electronic solder joints, exhibiting two solid-state phases: the monoclinic η'-Cu₆Sn₅ at lower temperatures and the hexagonal η-Cu₆Sn₅ at higher temperatures. This study investigates the effects of electric current on these phases using synchrotron-based techniques to assess phase stability and transformation. In-situ X-ray diffraction revealed a phase transition from η'-Cu₆Sn₅ to η-Cu₆Sn₅ under electric current, marked by shifts in diffraction peaks and lattice parameter changes. Additionally, in-situ nanodiffraction demonstrated strain relaxation and stable grain orientation in the hexagonal phase during current application. Complementary transmission electron microscopy identified dislocation density changes linked to the phase analysis, while nanoindentation highlighted variations in Young’s modulus and hardness. This research offers insights into electric current-induced phase transitions and mechanical behavior, enhancing our understanding of intermetallic compound reliability in advanced electronic packaging. |
| Proceedings Inclusion? |
Undecided |
| Keywords |
Characterization, Electronic Materials, Phase Transformations |