| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2025: In-Situ Characterization Techniques
|
| Presentation Title |
Microstructural Characterization of Nitrided Low Alloy Steel Using EPMA Scatter Diagram Method |
| Author(s) |
Kazunori Tsukamoto, Takashi Kimura, Kim Minheon, Osamu Umezawa |
| On-Site Speaker (Planned) |
Kazunori Tsukamoto |
| Abstract Scope |
The scatter diagram method using the electron probe microanalyzer (EPMA) is an analytical technique capable of examining compounds and slight compositional heterogeneity.
Using this technique, we examined the surface microstructure of nitrided low-alloy steel SCM440 [JIS]. Nitrided SCM440 has a compound layer with iron nitride and carbide on the surface layer. Under the compound layer, a 5-10 micrometer-thick region consisting of nanostructures was found. EPMA scatter diagram analysis identified that the region has homogeneous composition on the submicron scale, and its average composition is equivalent to that of the γ-phase. Further, EBSD analysis using the pattern matching method detected BCC nanograins in parts of this region.
The complementary combination of EPMA scatter diagram analysis with quantitative composition information and EBSD analysis with crystal information allowed us to estimate that fine microstructures transformed from the γ-phase were formed under the compound layer. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Iron and Steel, Other |