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Meeting

2025 TMS Annual Meeting & Exhibition

Symposium

Novel Strategies for Rapid Acquisition and Processing of Large Datasets from Advanced Characterization Techniques

Presentation Title

Rapid Data-Driven Non-Destructive Inspection of Additively Manufactured IN718 Using the Side-Band Peak Counting (SPC) Non-Linear Ultrasonics Method

Author(s)

I-Ting Ho, Krishna Muralidharan, Sammy Tin, Devin Richard Bayly, Pierre Deymier, Tribikram Kundu

On-Site Speaker (Planned)

I-Ting Ho

Abstract Scope

In this investigation, we employ the sideband peak counting (SPC) method to inspect additively manufactured Inconel 718 (IN718) parts. Using a broadband signal to interrogate the IN718 components, we quantified the acoustic spectral response of the parts via a unique index namely the SPC-Index (SPC-I). Validated by microfocus X-ray computed tomography (XCT), the variation in the SPC-I for the different components was found to directly correlate to the the behaviors of porosities within the IN718 parts. The findings unambiguously demonstrate that the variation in SPC-I could be an effective method to discern spatial distribution of the pores as well as pore-size distribution. In this regard, we put forth a data-driven framework driven by deep neural networks that integrates SPC-I with XCT towards new advanced quality control protocols for inspecting additively manufactured components.

Proceedings Inclusion?

Planned:

Keywords

Other, Other, Additive Manufacturing

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