About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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Novel Strategies for Rapid Acquisition and Processing of Large Datasets from Advanced Characterization Techniques
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Presentation Title |
Rapid Data-Driven Non-Destructive Inspection of Additively Manufactured IN718 Using the Side-Band Peak Counting (SPC) Non-Linear Ultrasonics Method |
Author(s) |
I-Ting Ho, Krishna Muralidharan, Sammy Tin, Devin Richard Bayly, Pierre Deymier, Tribikram Kundu |
On-Site Speaker (Planned) |
I-Ting Ho |
Abstract Scope |
In this investigation, we employ the sideband peak counting (SPC) method to inspect additively manufactured Inconel 718 (IN718) parts. Using a broadband signal to interrogate the IN718 components, we quantified the acoustic spectral response of the parts via a unique index namely the SPC-Index (SPC-I). Validated by microfocus X-ray computed tomography (XCT), the variation in the SPC-I for the different components was found to directly correlate to the the behaviors of porosities within the IN718 parts. The findings unambiguously demonstrate that the variation in SPC-I could be an effective method to discern spatial distribution of the pores as well as pore-size distribution. In this regard, we put forth a data-driven framework driven by deep neural networks that integrates SPC-I with XCT towards new advanced quality control protocols for inspecting additively manufactured components. |
Proceedings Inclusion? |
Planned: |
Keywords |
Other, Other, Additive Manufacturing |