| About this Abstract |
| Meeting |
TMS Specialty Congress 2025
|
| Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
| Presentation Title |
Multiscale Microstructure and Strain Characterisation in Aluminium Using Dark-Field X-Ray Microscopy |
| Author(s) |
Adam Cretton, Albert Zelenika, Johann Haack, Felix Frankus, Sina Borgi, Flemming Grumsen, Can Yıldırım, Carsten Detlefs, Grethe Winther, Henning Friis Poulsen |
| On-Site Speaker (Planned) |
Adam Cretton |
| Abstract Scope |
Using Dark-Field X-ray Microscopy (DFXM), this study captures the multimodal evolution of strain and dislocation dynamics in bulk aluminium samples, revealing insights into deformation mechanisms. DFXM enables simultaneous in-situ 3D mapping of dislocation density, local orientation, and elastic strain fields, capturing the complex scale-bridging interactions that govern plasticity. Observations show that dislocation cells form stochastically at low strains but exhibit a transition near 5.20% strain, where strain accommodation progresses through the emergence of geometrically necessary boundaries (GNBs) that accommodate larger strain gradients. By tracking boundary evolution and strain accommodation across deformation steps, this multimodal approach demonstrates scaling behavior and highlights universal stochastic processes in dislocation structuring under strain. We extend these findings with ongoing work in 4D tracking, analysing evolving dislocation patterns and providing data applicable to dislocation dynamics and crystal plasticity models. |
| Proceedings Inclusion? |
Undecided |