| About this Abstract |
| Meeting |
MS&T24: Materials Science & Technology
|
| Symposium
|
Additive Manufacturing: Microstructure, Defects, and Properties
|
| Presentation Title |
Application of a Single Objective Optimization Algorithm on Residual Strain Extraction from Electron Backscatter Diffraction Patterns |
| Author(s) |
Crestienne Alexandra Dechaine, Marc De Graef |
| On-Site Speaker (Planned) |
Crestienne Alexandra Dechaine |
| Abstract Scope |
We report on a novel method for the quantification of residual strain in additively manufactured (AM) 316L stainless steel via Electron Backscatter Diffraction (EBSD) using a dictionary-based approach coupled with a single objective optimization algorithm, to extract a deformation gradient tensor from the Kikuchi patterns. The determination of residual strain distributions in AM parts is essential for obtaining an understanding of the influence of manufacturing parameters on the thermal shrinkage and expansion in a constrained geometry. Furthermore, the information gained about the residual strain can be used to optimize the manufacturing parameters to minimize the residual strain. Initial algorithm validation was carried out using an EBSD data set collected from a nano-indented silicon sample. The dictionary approach with optimization was also compared to the more conventional High Resolution Electron Backscatter approach (HR-EBSD) implemented in OpenXY. |