| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Thin Films and Coatings: Properties, Processing and Applications
|
| Presentation Title |
Electro-Mechanical Behavior of Indium Tin Oxide Thin Films Deposited on Flexible Substrates |
| Author(s) |
Thibault Chommaux, Pierre-Olivier Renault, Pierre Godard, Philippe Goudeau, Dominique Thiaudière |
| On-Site Speaker (Planned) |
Thibault Chommaux |
| Abstract Scope |
The electrical and mechanical behavior of crystalline indium tin oxide (ITO) thin films, subjected to equi-biaxial deformation, is strongly dependent of the microstructure, but also of the organization in multilayer systems, if associated with a metallic layer (Ag). The study of the electromechanical behavior of composite materials was carried out through in situ deformation experiments characterized with a multi-scale approach, combining measurements of elastic strains by X-ray diffraction (XRD), macroscopic strains by digital image correlation (DIC) and electrical resistivity. This work emphasises the complementarity between the XRD microstructural characterizations and the electrical characterizations performed with the Van der Pauw method. In particular, the cracks propagation has been accurately established, and the link with the presence of punctual defects in the microstructure has been highlighted. These original experiments have also allowed to carry out an in-depth investigation of the electrical piezoresistivity and the elastic anisotropy of ITO. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Thin Films and Interfaces, Mechanical Properties, Other |