| About this Abstract |
| Meeting |
2020 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
In-situ Mapping of Twin Related Local Stress Fields in HCP Titanium |
| Author(s) |
Arul Kumar Mariyappan, Laurent Capolungo, Rodney McCabe, Wenjun Liu, Jon Tischler, Carlos Tome |
| On-Site Speaker (Planned) |
Arul Kumar Mariyappan |
| Abstract Scope |
Deformation twinning in a crystal results in a significant lattice-reorientation and localized shear in the narrow twin domain; hence heterogeneity in stresses develops at and in the vicinity of twins. These stresses strongly influence further twin growth and de-twinning processes but are extremely difficult to characterize experimentally. In this study, an in-situ synchrotron experiment with differential-aperture X-ray microscopy is performed to measure the 3D stresses in the vicinity of a {10-12} twin in hexagonal close packed titanium with a spatial resolution of 0.5-micron. Rolled and recrystallized titanium with a strong basal-texture is subjected to bending to introduce tensile-twins. The measured stresses help to quantify the heterogeneity associated with twinning and also to characterize the dynamic processes involved with twinning. Under further-straining the twin grows heterogeneously and the local growth correlates well with the measured local stresses. This work significantly advances our understanding of twinning and also guides modeling tool development. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |