| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Microstructural Evolution and Material Properties Due to Manufacturing Processes: A Symposium in Honor of Anthony Rollett
|
| Presentation Title |
An Overview of Synchrotron X-ray Microscopies: From Macro to Nano |
| Author(s) |
Robert M. Suter |
| On-Site Speaker (Planned) |
Robert M. Suter |
| Abstract Scope |
Current work is extending development of synchrotron X-ray microscopies that study structure in polycrystalline materials. Applications are generating new understanding of properties and responses that were previously only indirectly measured. This presentation will provide an overview of methods and will illustrate applications by an expanding community. Professor Tony Rollett has played a central role in these developments and, specifically, in my own work. He has continuously supported development of High Energy Diffraction Microscopy which nondestructively generates 3D maps of microstructures. We have collaborated on measurements of grain growth, recrystallization and deformation development. Recently, we have been part of a collaborative effort to turn Bragg Coherent Diffraction Imaging into a tool for fundamental materials science. BCDI generates images of micron scale crystals and internal lattice displacements associated with defects. With the demonstrated ability to measure multiple Bragg peaks from multiple contacting grains, observations of dislocation motions and interactions should soon follow. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Modeling and Simulation, ICME, Shaping and Forming |