About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
3rd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2025)
|
Presentation Title |
Hierarchical Bayesian Modeling for Enhanced Contamination Detection in Electron Beam Powder Bed Fusion Processes |
Author(s) |
Temilola Gbadamosi-Adeniyi, Tim Horn |
On-Site Speaker (Planned) |
Temilola Gbadamosi-Adeniyi |
Abstract Scope |
Contamination in Electron Beam Powder Bed Fusion (EB-PBF) critically affects material integrity and component performance. Leveraging advancements in Total Electron Emission (TEE) data, which reveal material composition, contrast, and topography, this study introduces a hierarchical Bayesian model to detect and quantify contamination across all EB-PBF layers. The model proficiently distinguishes between the presence and absence of contamination at each spatial location and layer. Incorporating a Gaussian Process (GP) captures spatial correlations, ensuring the generation of coherent contamination maps throughout the build. Preliminary results demonstrate the model's effectiveness in accurately identifying contamination-free regions, reliably detecting intentionally introduced contamination, and quantifying contamination spread in subsequent layers. Posterior predictive checks validate the model’s robustness, showing strong alignment between simulated TEE signals and observed data. This hierarchical Bayesian framework offers a scalable and interpretable solution for enhancing process monitoring and quality control in additive manufacturing processes. |
Proceedings Inclusion? |
Undecided |