| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Neutron and X-ray Scattering in Materials Science and Engineering
|
| Presentation Title |
In-Situ and Multimodal Capabilities of Laue Diffraction Instrument at 34-ID-E of the Advanced Photon Source |
| Author(s) |
Dina Sheyfer, Wenjun Liu, Jonathan Tischler |
| On-Site Speaker (Planned) |
Dina Sheyfer |
| Abstract Scope |
The Laue x-ray diffraction microscopy instrument at station 34-ID-E of the Advanced Photon Source at Argonne National Laboratory provides a unique capability to probe, non-destructively, the microstructure and strain in materials with sub-micron resolution in three dimensions and 1e-4 strain sensitivity. This poster will highlight recent and near future developments for users at 34-ID, including: (1) fast 3D Laue data measurements with use of coded aperture for depth resolving, (2) compatibility with in-situ instruments including capabilities for local deformation, local corrosion and battery materials studies, (3) new multimodal capabilities for photovoltaic materials that combines Laue microdiffraction with x-ray excited optical luminescence. In addition, streamlined data analysis capabilities and workflow are being implemented to perform real-time analysis that will guide experimental decision making. Our goal is to build a diverse user community for this new instrument and contribute to science across a broad range of disciplines. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Energy Conversion and Storage |