| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Alloys and Compounds for Thermoelectric and Solar Cell Applications XI
|
| Presentation Title |
In-situ Creep Deformation Electrical Conductivity Measurement of I-doped PbTe |
| Author(s) |
Muath Almalki, Yukun Liu, James Male, Vinayak Dravid, David Dunand, G. Jeffrey Snyder |
| On-Site Speaker (Planned) |
Muath Almalki |
| Abstract Scope |
Although the mechanical behavior of thermoelectric materials has been gaining interest in the community, little has been done to understand its real impact on the transport properties. Creep deformation could be one of the design limitations, not just because of the introduced dimensional instability, but also due to the impact it leaves on the electronic transport. In this talk, we report the in-situ high temperature creep-electrical conductivity measurement for I-doped PbTe. There, the drop in electrical conductivity was shown to scale linearly with the strain, Minimal direct influence of point defects is expected, and such conductivity drop is attributed mainly to the increased dislocation density. TEM examination of the deformed samples revealed the formation of sub-grain boundaries that are considered stable against climb annihilation. This, in fact, opens a door to introduce stable dislocations structures with minimal impact on the electrical conductivity, but significant enough to reduce the thermal counterpart. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Electronic Materials, Mechanical Properties, Energy Conversion and Storage |