About this Abstract |
Meeting |
TMS Specialty Congress 2025
|
Symposium
|
The 7th International Congress on 3D Materials Science (3DMS 2025)
|
Presentation Title |
Pushing Boundaries in 3D Microstructure Mapping: The New DFXM Beamline at ESRF ID03 |
Author(s) |
Can Yildirim, Helena Isern, Thomas Dufrane, Marilyn Sarkis, Yaozhu Li, Abderrahmane Benhadjira, Raquel Rodriguez-Lamas, Ricardo Hino, Philipp Brumund, Emmanuel Papillon, Thierry Brochard, Damien Scortani, Carsten Detlefs |
On-Site Speaker (Planned) |
Can Yildirim |
Abstract Scope |
The ESRF’s Dark Field X-ray Microscopy (DFXM) beamline at ID03 heralds a new era for 3D mapping of crystalline orientation and strain, advancing multi-scale imaging capabilities within embedded microstructures. Emerging from ESRF’s EBSL2 Upgrade Project, ID03 offers unprecedented opportunities in high-resolution, non-destructive mapping. Relocated and upgraded from ID06-HXM, the beamline now features state-of-the-art X-ray optics for pink and monochromatic x-rays, a new goniometer, and a detection system tailored to capture subtle microstructural phenomena. Since opening to users in April 2024, the beamline’s unique setup supports complex studies, from metal strain mapping to functional material assessments in semiconductors, biominerals, and energy systems. By expanding access to multi-modal, in-situ exploration, ID03 is positioned to drive innovation across materials science disciplines, meeting the needs of next-generation research in structure-property relationships. |
Proceedings Inclusion? |
Undecided |