About this Abstract |
Meeting |
2025 TMS Annual Meeting & Exhibition
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Symposium
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Mechanical Response of Materials Investigated Through Novel In-Situ Experiments and Modeling
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Presentation Title |
Evaluation of the ΔT Creep Test as a Parallelized Test Method |
Author(s) |
Artur Leonel Machado Ulsenheimer, Christo Boudreault, Calvin M Stewart |
On-Site Speaker (Planned) |
Artur Leonel Machado Ulsenheimer |
Abstract Scope |
This study investigates the ΔT creep test as a parallelized method to capture comprehensive creep data at multiple temperatures along a single specimen. Conventional creep tests typically require several years to acquire a single data point, significantly delaying the deployment of new high-temperature materials. The ΔT test introduces a quasi-static temperature gradient along the specimen, monitored by thermocouples and a FLIR infrared camera. Strain mapping is performed using Digital Image Correlation (DIC). This method allows for the determination of Minimum Creep Strain Rate (MCSR) and partial creep curves at different temperatures along the specimen, facilitating the calculation of activation energy and the calibration of constitutive equations. Expected outcomes indicate that the ΔT test can produce MCSR data comparable to conventional creep tests, significantly reducing the number of specimens required, thereby lowering material volume, testing costs, and accelerating the acquisition of creep resistance data. |
Proceedings Inclusion? |
Planned: |
Keywords |
Mechanical Properties, High-Temperature Materials, Other |