About this Abstract |
Meeting |
TMS Specialty Congress 2024
|
Symposium
|
2nd World Congress on Artificial Intelligence in Materials & Manufacturing (AIM 2024)
|
Presentation Title |
Improved Deep Learning Image Classification of Rare Material Defects in Non-destructive-testing Processes by Utilizing Data Imbalance Methods and Synthetic Data |
Author(s) |
Yann Niklas Schoebel, Martin Mueller |
On-Site Speaker (Planned) |
Yann Niklas Schoebel |
Abstract Scope |
Data Imbalance is a common problem in real world Machine-Learning datasets from industrial processes. Even more in Non-Destructive-Testing (NDT) applications, where some types of relevant material defects occur rarely. Therefore, effective measures against Data Imbalance are required to apply Deep Learning in this field. In this work, we evaluate the influence of increasing Data Imbalance on an Image Classification dataset of material defects sampled from macro etch testing on Nickel-Superalloy turbine disks. Furthermore, we investigate how conventional Data Imbalance approaches on the one hand and synthetic generated images on the other hand can reduce the influence of imbalance. We also compare human and machine perception to evaluate if such approaches can profit from manual filtering of the synthetic samples. Finally, we draw the conclusion if synthetic data generation is a valuable tool for highly imbalanced datasets in NDT applications and if it can outperform classic Data Imbalance countermeasures. |
Proceedings Inclusion? |
Definite: Other |