| About this Abstract |
| Meeting |
2025 TMS Annual Meeting & Exhibition
|
| Symposium
|
Microstructural Evolution and Material Properties Due to Manufacturing Processes: A Symposium in Honor of Anthony Rollett
|
| Presentation Title |
Development of Coherent X-Ray Imaging for Nanometer Scale Strain Dynamics at Grain Boundaries |
| Author(s) |
Richard L. Sandberg, Stephan Hruszkewycz, Ross Harder |
| On-Site Speaker (Planned) |
Richard L. Sandberg |
| Abstract Scope |
Recent developments in x-ray synchrotron sources have increased the available coherent flux by upwards of two orders of magnitude. These new upgraded sources will enable increased resolution of materials at the nanometer scale and in shorter times for in situ studies. We have been developing nanometer scale strain measurements of multiple grains through Bragg coherent diffraction imaging (BCDI). BCDI provides nanometer-scale strain imaging of crystalline materials in 3D and is complimentary to other x-ray imaging techniques such as high energy diffraction microscopy (HEDM) and diffraction contrast tomography (DCT). In collaboration with Prof. Anthony Rollett, we are developing BCDI as a rapid, robust method for imaging the full 3D strain tensor at the nanometer scale. We will discuss progress to image strain and dislocation dynamics across grain boundaries with BCDI to study materials dynamics and increased understanding of failure mechanisms. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Thin Films and Interfaces, Nanotechnology, |