| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Phase Differentiation in Half- and Full-Heusler Composites Using EBSD |
| Author(s) |
Patrick Gregory Callahan, McLean Echlin, Jason Douglas, Tresa Pollock |
| On-Site Speaker (Planned) |
Patrick Gregory Callahan |
| Abstract Scope |
Half- and full-Heusler composite materials are promising thermoelectric materials. The interfacial boundaries between phases in these composites play an important role reducing thermal conductivity by scattering phonons. Here we show that electron backscatter diffraction (EBSD) can be used to differentiate between half-Heusler NiTiSn and full-Heusler Ni2TiSn in a composite material. Due to the similarity in EBSD patterns of the F-43m NiTiSn (SG 216) and the Fm3m Ni2TiSn (SG 225), traditional Hough indexing fails to discriminate between these two phases. Previously, EDS was used to differentiate between the two phases, with considerable reduction in collection speed. Here we show advanced EBSD indexing techniques including dictionary indexing, template matching, or spherical indexing enables phase differentiation between the two phases. We will also show that EBSD can be used to identify grain boundaries within half-Heusler regions traditional indexing would fail to identify by studying the profile of Kikuchi bands in addition to location. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, |