About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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Advanced Characterization Techniques for Quantifying and Modeling Deformation
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Presentation Title |
Deformation Mechanisms in Irradiated Materials Revealed by in situ High Energy Synchrotron X-rays |
Author(s) |
Meimei Li, Xuan Zhang, Jonathan Almer, Jun-Sang Park, Peter Kenesei |
On-Site Speaker (Planned) |
Meimei Li |
Abstract Scope |
High-energy synchrotron x-rays have a unique advantage over other characterization techniques in probing deformation and failure mechanisms in structural materials because of their deep penetration, high brilliance, and high flux. This presentation will highlight the applications of wide-angle x-ray scattering and small-angle x-ray scattering for in situ 2D characterization of grain-averaged deformation behavior, and high-energy diffraction microscopy and x-ray tomography for in situ 3D studies of grain-scale heterogeneous deformation in neutron-irradiated ferritic and austenitic alloys. It will address the effects of irradiation-induced defects on deformation and failure mechanisms, and the effect of irradiation on deformation-induced phase transformation in Fe-based alloys. The critical microstructural parameters, e.g. dislocation density, substructure size, internal strain/stress, void population inferred from the high-energy synchrotron x-ray measurements will also be discussed. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |